SOLIDSPEC-3700/3700DUV
Solution for optics, semiconductors and FPD applications
Shimadzu SolidSpec-3700/3700DUV are the top-of-the-line spectrophotometer with high sensitivity, deep UV measurement and a large sample compartment. The SolidSpec-3700/3700DUV responds to the following requirements in optical, semiconductor and FPD applications.
FPD:
High-sensitivity measurement in NIR and a large sample compartment for material evaluation
Semiconductors:
Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement
Optical communications:
High-sensitivity measurement of anti-reflection films in NIR
Optics:
High-sensitivity measurement from deep UV to NIR, and a large sample compartment
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SOLIDSPEC-3700 
